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Characterization of Si Hybrid CMOS Detectors for use in the Soft X-ray Band

机译:用于软X射线的si混合CmOs探测器的表征   带

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摘要

We report on the characterization of four Teledyne Imaging Systems HAWAIIHybrid Si CMOS detectors designed for X-ray detection. Three H1RG detectorswere studied along with a specially configured H2RG. Read noise measurementswere performed, with the lowest result being 7.1 e- RMS. Interpixel capacitivecrosstalk (IPC) was measured for the three H1RGs and for the H2RG. The H1RGshad IPC upper limits of 4.0 - 5.5 % (up & down pixels) and 8.7 - 9.7 % (left &right pixels), indicating a clear asymmetry. Energy resolution is reported fortwo X-ray lines, 1.5 & 5.9 keV, at multiple temperatures between 150 - 210 K.The best resolution measured at 5.9 keV was 250 eV (4.2 %) at 150 K, with IPCcontributing significantly to this measured energy distribution. The H2RG, witha unique configuration designed to decrease the capacitive coupling betweenROIC pixels, had an IPC of 1.8 +/- 1.0 % indicating a dramatic improvement inIPC with no measurable asymmetry. We also measured dark current as a functionof temperature for each detector. For the detector with the lowest darkcurrent, at 150 K, we measured a dark current of 0.020 +/- 0.001 (e- sec-1pix-1). There is also a consistent break in the fit to the dark current datafor each detector. Above 180 K, all the data can be fit by the product of apower law in temperature and an exponential. Below 180 K the dark currentdecreases more slowly; a shallow power law or constant must be added to eachfit, indicating a different form of dark current is dominant in thistemperature regime. Dark current figures of merit at 293 K are estimated fromthe fit for each detector.
机译:我们报告了用于X射线检测的四个Teledyne成像系统HAWAIIHybrid Si CMOS检测器的特性。研究了三个H1RG检测器以及一个特殊配置的H2RG。进行了读取噪声测量,最低结果为7.1 e-RMS。测量了三个H1RG和H2RG的像素间电容串扰(IPC)。 H1RGshad IPC的上限为4.0-5.5%(上下像素)和8.7-9.7%(左右像素),表明存在明显的不对称性。据报道,在150-210 K的多个温度下,两条X射线线分别为1.5和5.9 keV的能量分辨率。在5.9 keV下测得的最佳分辨率在150 K下为250 eV(4.2%),IPC对该测量的能量分布做出了重要贡献。 H2RG具有旨在减少ROIC像素之间的电容耦合的独特配置,其IPC为1.8 +/- 1.0%,这表明IPC有了显着改善,而没有可测量的不对称性。我们还测量了每个探测器的暗电流与温度的关系。对于在150 K下具有最低暗电流的检测器,我们测得的暗电流为0.020 +/- 0.001(e-sec-1pix-1)。每个探测器对暗电流数据的拟合也存在一个连续的中断。高于180 K时,所有数据都可以由幂律在温度和指数上的乘积来拟合。低于180 K时,暗电流的下降速度更慢;每种拟合都必须添加浅功率定律或常数,这表明在此温度范围内,暗电流的不同形式占主导地位。根据每个探测器的适合度,估算出293 K时的暗电流品质因数。

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